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KELVIN CONTACT PROBE AND A KELVIN INSPECTION FIXTURE PROVIDED WITH SAME
KELVIN CONTACT PROBE AND A KELVIN INSPECTION FIXTURE PROVIDED WITH SAME
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机译：KELVIN接触式探针和KELVIN检验夹具同时提供
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摘要
[PROBLEMS] To provide a Kelvin contact probe capable of coping with pitch reduction of an electrode regardless of the shape of an electrode to be inspected and avoiding an increase in manufacturing cost of a circuit board and a Kelvin test jig including the same The purpose.The Kelvin test jig 100 includes contact probes 10 and 20 and one of the contact probes 10 includes an electrode side contact terminal 11 that contacts the solder ball 61, Side contact terminal 12 contacting the solder ball 61. The other contact probe 20 includes an electrode side contact terminal 21 that contacts the solder ball 61 and a land side contact The contact probes 10 and 20 include terminals 22 and 22 so that one electrode side inclined surface 11f and the other electrode side inclined surface 21f face each other while the other land side inclined surface 12f And the land side slope 22f on the other side face each other.;
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