首页> 外国专利> SUBSTRATE ALIGNER, SUBSTRATE TESTING APPARATUS INCLUDING SAME, AND SUBSTRATE ALIGNING METHOD USING SAME

SUBSTRATE ALIGNER, SUBSTRATE TESTING APPARATUS INCLUDING SAME, AND SUBSTRATE ALIGNING METHOD USING SAME

机译:基板报警器,包括相同功能的基板测试装置以及使用该功能的基板报警方法

摘要

Disclosed is a substrate aligner which is formed in a substrate test apparatus and aligns a substrate. The substrate aligner includes a control unit which includes a rotary head coming in contact with the lateral side of the substrate and rotating the substrate to control the position, a driving unit for providing a rotary force to the rotary head, and a gear unit for transmitting the rotary force of the driving unit to the rotary head between the control unit and the driving unit. As mentioned above, the substrate aligner includes the gear unit as well as the driving unit for providing the rotary force, thereby more minutely controlling a rotation angle of the rotary head in comparison with a conventional aligner.;COPYRIGHT KIPO 2018
机译:公开了一种在基板测试设备中形成并对准基板的基板对准器。基板对准器包括:控制单元,其包括与基板的侧面接触并旋转基板以控制位置的旋转头;用于向旋转头提供旋转力的驱动单元;以及用于传递的齿轮单元。驱动单元向控制单元和驱动单元之间的旋转头的旋转力。如上所述,基板对准器包括齿轮单元以及用于提供旋转力的驱动单元,因此与传统对准器相比,可以更精细地控制旋转头的旋转角度。; COPYRIGHT KIPO 2018

著录项

  • 公开/公告号KR20170137339A

    专利类型

  • 公开/公告日2017-12-13

    原文格式PDF

  • 申请/专利权人 SEMES CO. LTD.;

    申请/专利号KR20160069317

  • 申请日2016-06-03

  • 分类号H01L51/56;H01L21/66;H01L21/68;H01L21/687;H01L51;

  • 国家 KR

  • 入库时间 2022-08-21 12:41:47

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