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Optical microscope system for simultaneous observation of spatially distinct regions of interest

机译:光学显微镜系统,可同时观察感兴趣的空间不同区域

摘要

The invention relates to an optical microscope system (10) for the simultaneous measurement of at least two spatially distinct regions of interest, characterized by comprising at least two distinct optical measuring heads (12a, 12b, 12c) that can be simultaneously focused on spatially distinct arbitrary regions of interest, each optical measuring head is optically connectable with at least one scan head (14), the optical microscope system further comprising a control system (32) connected to the at least one scan head and the optical measuring head, the control system being configured to provide for synchronized control of the operation of the at least one scan head and the at least two optical measuring head.
机译:本发明涉及用于同时测量至少两个空间上不同的感兴趣区域的光学显微镜系统( 10 ),其特征在于包括至少两个不同的光学测量头( 12 > a, 12 b, 12 c )在空间上不同的任意感兴趣区域,每个光学测量头可与至少一个扫描头( 14 )光学连接,光学显微镜系统还包括控制系统( 32 )连接到至少一个扫描头和光学测量头的控制系统被配置为提供对至少一个扫描头和至少两个光学测量头的操作的同步控制。

著录项

  • 公开/公告号US9964750B2

    专利类型

  • 公开/公告日2018-05-08

    原文格式PDF

  • 申请/专利权人 FEMTONICS KFT.;

    申请/专利号US201315039601

  • 申请日2013-11-28

  • 分类号G02B21/18;G02B21/00;A61B3/13;A61B3/14;A61B5/00;

  • 国家 US

  • 入库时间 2022-08-21 12:55:22

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