η=iMαiPii=0NαiPi ]]> where M denotes the set of reference atomic masses, Pi denotes the partial pressures for the atomic masses measured by the mass spectrometer, the coefficients αi denote preset weighting coefficients associated with each partial pressure Pi, and N denotes a maximum atomic mass for which the partial pressure Pi can be measured by the mass spectrometer."/> Method for following degassing rate by measuring partial pressures measured by mass spectrometry
首页> 外国专利> Method for following degassing rate by measuring partial pressures measured by mass spectrometry

Method for following degassing rate by measuring partial pressures measured by mass spectrometry

机译:通过测量由质谱法测量的分压来跟踪脱气速率的方法

摘要

A method for following the degassing of a component placed in a vacuum chamber, comprises: measuring partial pressures Pi for a set M of reference atomic masses, by means of a mass spectrometer connected to the vacuum chamber; determining a degassing rate η, at least as a function of the measured partial pressures Pi; and, calculating a slope of the variation in the degassing rate. The degassing rate η may advantageously be determined by calculation by means of a relationship of the type:; <math overflow="scroll"><mrow><mrow><mi>η</mi><mo>=</mo><mfrac><mrow><munderover><mo>∑</mo><mrow><mi>i</mi><mo>∈</mo><mi>M</mi></mrow><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle></munderover><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mrow><msub><mi>α</mi><mi>i</mi></msub><mo>⁢</mo><msub><mi>P</mi><mi>i</mi></msub></mrow></mrow><mrow><munderover><mo>∑</mo><mrow><mi>i</mi><mo>=</mo><mn>0</mn></mrow><mi>N</mi></munderover><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle><mo>⁢</mo><mrow><msub><mi>α</mi><mi>i</mi></msub><mo>⁢</mo><msub><mi>P</mi><mi>i</mi></msub></mrow></mrow></mfrac></mrow><mo>⁢</mo><mstyle><mspace width="0.3em" height="0.3ex" /></mstyle></mrow></math> where M denotes the set of reference atomic masses, Pi denotes the partial pressures for the atomic masses measured by the mass spectrometer, the coefficients αi denote preset weighting coefficients associated with each partial pressure Pi, and N denotes a maximum atomic mass for which the partial pressure Pi can be measured by the mass spectrometer.
机译:一种用于对置于真空室中的部件进行脱气的方法,该方法包括:通过连接到真空室的质谱仪,测量一组参考原子质量M的分压P i 。至少根据测得的分压P i 确定脱气率η;计算除气率变化的斜率。脱气率η可以有利地通过以下类型的关系通过计算来确定: <![CDATA [<数学溢出=“ scroll”> η = i M α i P i i = 0 N α i P i ]]> 其中M表示参考原子质量的集合,P i 表示质谱仪测量的原子质量的分压,系数α i 表示与每个分压P i ,并且N表示最大原子质量,可以通过质谱仪测量该分压P i

著录项

  • 公开/公告号US9903801B2

    专利类型

  • 公开/公告日2018-02-27

    原文格式PDF

  • 申请/专利权人 THALES;

    申请/专利号US201414473457

  • 发明设计人 ALAIN ROGER DANTE BETTACCHIOLI;

    申请日2014-08-29

  • 分类号G01L7;G01N7/14;H01J49;H01J49/26;

  • 国家 US

  • 入库时间 2022-08-21 12:55:28

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号