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SYSTEM-INDEPENDENT CHARACTERIZATION OF MATERIALS USING DUAL-ENERGY COMPUTED TOMOGRAPHY

机译：使用双能计算机断层扫描技术对材料进行系统独立的表征

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摘要

A system for characterizing the material of an object scanned via a dual-energy computed tomography scanner is provided. The system generates photoelectric and Compton sinograms based on a photoelectric-Compton decomposition of low-energy and high-energy sinograms generated from the scan and based on a scanner spectral response model. The system generates a Compton volume with Compton attenuation coefficients from the Compton sinogram and a photoelectric volume with photoelectric attenuation coefficients from the photoelectric sinogram. The system generates an estimated effective atomic number for a voxel and an estimated electron density for the voxel from the Compton attenuation coefficient and photoelectric coefficient for the voxel and scanner-specific parameters. The system then characterizes the material within the voxel based on the estimated effective atomic number and estimated electron density for the voxel. This information can be used to provide a mapping of known effective atomic numbers and known electron densities to known materials.

机译：提供了一种用于表征经由双能计算机断层摄影扫描仪扫描的物体的材料的系统。该系统基于从扫描生成的低能和高能正弦图的光电康普顿分解并基于扫描仪光谱响应模型，生成光电和康普顿正弦图。该系统根据康普顿正弦图生成具有康普顿衰减系数的康普顿体积，并根据光电正弦图生成具有光电衰减系数的光电体积。该系统根据针对像素和扫描仪特定参数的康普顿衰减系数和光电系数，为像素生成估算的有效原子序数，并为像素生成估算的电子密度。然后，系统根据估算的有效原子序数和估算的体素电子密度来表征体素中的材料。该信息可用于提供已知有效原子序数和已知电子密度到已知材料的映射。

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公开/公告号US2018120241A1

专利类型
公开/公告日2018-05-03

原文格式PDF
申请/专利权人 LAWRENCE LIVERMORE NATIONAL SECURITY LLC;
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申请/专利号US201615339821
发明设计人 ISAAC SEETHO;MAURICE B. AUFDERHEIDE;STEPHEN G. AZEVEDO;WILLIAM D. BROWN;KYLE CHAMPLEY;DANIEL SCHNEBERK;G. PATRICK ROBERSON;JEFFREY S. KALLMAN;HARRY E. MARTZ JR.;JEREL A. SMITH;
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申请日2016-10-31
分类号G01N23/046;G01N23/083;
国家 US
入库时间 2022-08-21 13:02:34

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