Sample holder for scanning electron microscopy (SEM) and atomic force microscopy (AFM)

• 1. 用于在线SEM观察的SEM样品夹具及SEM样品观察方法 [P] . 中国专利： CN102646566B . 2016.12.14
• 2. 用于在线SEM观察的SEM样品夹具及SEM样品观察方法 [P] . 中国专利： CN102646566A . 2012-08-22
• 3. SAMPLE HOLDER FOR SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM). [P] . MX364380B . 2019-04-24

  机译： 用于扫描电子显微镜（SEM）和原子力显微镜（AFM）的样品夹。

• 4. SAMPLE HOLDER FOR SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM). [P] . MX2015016988A . 2017-06-09

  机译： 用于扫描电子显微镜（SEM）和原子力显微镜（AFM）的样品夹。

• 5. SAMPLE HOLDER FOR SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM) [P] . 美国专利： US2017169989A1 . 2017-06-15

  机译： 扫描电子显微镜（SEM）和原子力显微镜（AFM）的样品夹

• 1. Probing Co/Si interface behaviour by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) [J] . 核技术（英文版） . 2006,第004期
• 2. Visualization of atomic scale reaction dynamics of supported nanocatalysts during oxidation and ammonia synthesis using in-situ environmental(scanning) transmission electron microscopy [J] . Michael R.Ward, Robert W.Mitchell, Edward D.Boyes, 能源化学：英文版 . 2021,第006期
• 3. Visualization of atomic scale reaction dynamics of supported nanocatalysts during oxidation and ammonia synthesis using in-situ environmental (scanning) transmission electron microscopy [J] . Michael R.Ward, Robert W.Mitchell, Edward D.Boyes, 天然气化学（英文版） . 2021,第006期
• 4. Scanning Electron Microscopy (SEM) of the Bug Eye and Sand Coral [J] . Sayid Ali Sayid, Aliyu Dadan-Garba, Daniel Elaigwu Enenche, 显微镜研究(英文) . 2020,第001期
• 5. Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles [J] . Sobchenko I, Pesicka J, Baither D, Philosophical magazine: structure and properties of condensed matter . 2007,第16a17期
• 6. Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy(AFM)and Scanning Electron Microscopy(SEM) [J] . Jeesun Lim, Kang-Mu Lee, So Hyun Kim Bulletin of the Korean Chemical Society . 2008,第11期
• 7. Nanoscale Characterization of Escherichia coli Biofilm Formed under Laminar Flow Using Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) [J] . Hyun Sun Yun, Jeesun Lim, Kang Mu Lee, Bulletin of the Korean Chemical Society . 2008,第11期
• 8. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complementary Techniques for High Resolution Surface Investigations [C] . P. Russell, D. Batchelor, J. Thornton International conference on surface modification technologies . 2002
• 9. Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) studies of carbon fibers and interfacial bonding in polyimide composites. [D] . Jangchud, Ittipol. 1996
• 10. Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy (SECM-AFM) Probes to Image Surface Topography and Reactivity at the Nanoscale [O] . Jeyavel Velmurugan, Amit Agrawal, Sangmin An, -1
• 11. Progress of Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA) for Pulp and Paper Specimens. (Part II). Observation at High Magnification by Using Field Emission-SEM (FE-SEM) and Atomic Force Microscope (AFM). [O] . Tadahira Hamada 1999
• 12. Atomic Force MIcroscopy and Scanning Tunneling Microscopy with a Combination Atomic Force Microscope/Scanning Tunneling Microscopy [R] . Marti, O., Drake, B., Gould, S., 1988

• 1. Scanning Electron Microscopy (SEM) Analysis and Hardness of Diffusion Bonded Titanium-Titanium and Titanium-Copper Plates with Static Force and without Interlayers [J] . Joel Hemanth . 复合材料期刊（英文） . 2017,第2期
• 2. 扫描电子显微镜(SEM)技术在古籍保护分析中的应用 [C] . 吕淑贤 . 北京大学图书馆第十二届五四科学讨论会 . 2016
• 3. 原子力显微镜(AFM)对霍奇金淋巴瘤HRS细胞16种抗体结合的观察 [A] . 纪星涉 . 2014