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Method of manufacturing SiC wafer, method of manufacturing SiC semiconductor, and graphite silicon carbide composite substrate

机译:SiC晶片的制造方法,SiC半导体的制造方法以及石墨碳化硅复合基板

摘要

Provided is a method for producing an SiC wafer, said method comprising: a step of preparing a graphite-silicon carbide composite substrate that has a vitreous carbon layer on the surface of a graphite substrate and a CVD-SiC layer atop the vitreous carbon layer, and preparing a single-crystal SiC substrate that has on the surface an ion injection layer into which hydrogen ions have been injected; a joining step in which a joined body is obtained by bonding the CVD-SiC layer of the graphite-silicon carbide composite substrate and the ion injection layer of the single-crystal SiC substrate; a first separation step in which a single-crystal coated substrate is obtained by heating the joined body and separating the ion injection layer from the single-crystal SiC substrate; and a second separation step in which an SiC wafer is obtained by separating the vitreous carbon layer and CVD-SiC layer of the single-crystal coated substrate.
机译:提供了一种SiC晶片的制造方法,所述方法包括以下步骤:制备石墨-碳化硅复合衬底,所述石墨-碳化硅复合衬底在石墨衬底的表面上具有玻璃碳层,并且在所述玻璃碳层之上具有CVD-SiC层。制备单晶SiC衬底,该SiC单晶衬底的表面上具有注入了氢离子的离子注入层。接合步骤,其中通过将石墨-碳化硅复合衬底的CVD-SiC层与单晶SiC衬底的离子注入层接合而获得接合体;第一分离步骤,其中通过加热接合体并将离子注入层与单晶SiC衬底分离来获得单晶涂覆的衬底;第二分离步骤,其中通过分离单晶涂覆基板的玻璃碳层和CVD-SiC层来获得SiC晶片。

著录项

  • 公开/公告号JP6371143B2

    专利类型

  • 公开/公告日2018-08-08

    原文格式PDF

  • 申请/专利权人 イビデン株式会社;

    申请/专利号JP20140140565

  • 发明设计人 古市 渉;長田 淳仁;水向 祐樹;

    申请日2014-07-08

  • 分类号H01L21/02;H01L21/265;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:37

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