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Apparatus, method, and program for measuring light distribution of a light source and bidirectional reflectance distribution function of an object

机译:用于测量光源的光分布和物体的双向反射率分布函数的设备,方法和程序

摘要

PROBLEM TO BE SOLVED: To provide a device, method and program for measuring light distribution of a light source.SOLUTION: A light distribution measurement device includes: imaging means of imaging an object having known reflection characteristic in a state of being illuminated by a light source, and acquiring an actual value of a sensor response value; sensor response value calculation means of calculating a calculation value of the sensor response value on the basis of a positional relationship between a shape model of the light source and the object, and a light distribution model; difference calculation means of calculating a difference between the actual value and calculation value of the sensor response value; and parameter estimation means of optimizing a parameter of the light distribution model as a target, and estimating a parameter for making the difference minimum.
机译:解决的问题:提供一种用于测量光源的光分布的设备,方法和程序。解决方案:光分布测量设备包括:成像装置,其在被​​光照射的状态下对具有已知反射特性的物体进行成像。源,获取传感器响应值的实际值;传感器响应值计算装置,根据光源和物体的形状模型与配光模型之间的位置关系,计算传感器响应值的计算值。差计算装置,计算传感器响应值的实际值与计算值之间的差。参数估计装置,其将作为目标的配光模型的参数最佳化,并估计使差最小的参数。

著录项

  • 公开/公告号JP6379651B2

    专利类型

  • 公开/公告日2018-08-29

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20140099662

  • 发明设计人 高瀬 紘一;

    申请日2014-05-13

  • 分类号G01J1/00;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 13:09:51

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