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Inspection data processing apparatus and inspection data processing method
Inspection data processing apparatus and inspection data processing method
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机译：检验数据处理设备和检验数据处理方法
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摘要
An examination data processing device (50) is provided with a reference space generating unit (4) and a normal/abnormal determination unit (6). The reference space generating unit (4) randomly extracts a plurality of data items from a data item group that contains a prescribed number of data items that indicate characteristic amounts of a normal product, and the reference space generating unit repeatedly executes, for only a prescribed number of times, processing for calculating a representative characteristic amount that represents the characteristic amounts indicated by the plurality of extracted data items. In addition, the reference space generating unit (4) generates a reference space from the data item group that contains the prescribed number of data items which indicate the representative characteristic amount calculated by the prescribed number of repeated executions. The normal/abnormal determination unit (6) determines whether an examination subject is a normal product or an abnormal product on the basis of the size of the distance between the generated reference space and the data items which indicate the characteristic amounts of the examination subject.
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