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DEVICE AND METHOD FOR GENERATING FREQUENCY SHIFT TERAHERTZ WAVES, DEVICE AND METHOD FOR MEASURING FREQUENCY SHIFT TERAHERTZ WAVES, DEVICE AND METHOD FOR DETECTING TOMOGRAPHIC STATE, AND DEVICE AND METHOD FOR MEASURING SAMPLE CHARACTERISTIC
DEVICE AND METHOD FOR GENERATING FREQUENCY SHIFT TERAHERTZ WAVES, DEVICE AND METHOD FOR MEASURING FREQUENCY SHIFT TERAHERTZ WAVES, DEVICE AND METHOD FOR DETECTING TOMOGRAPHIC STATE, AND DEVICE AND METHOD FOR MEASURING SAMPLE CHARACTERISTIC
PROBLEM TO BE SOLVED: To provide a novel technique for generating frequency shift terahertz waves, a terahertz band measurement technique, especially a technique for detecting a tomographic state of a structure.;SOLUTION: A frequency shift terahertz wave measurement method of the present invention, comprises: a light beat signal output step for using frequency shift laser light which shifts in frequency and monochromatic laser light having a center frequency of which the difference from a center frequency of the frequency shift laser light is a terahertz wave frequency so as to combine the frequency shift laser light with the monochromatic laser light and output light beat signals having beats of a terahertz cycle; a frequency shift terahertz wave generation step for producing a current vibrating at a terahertz wave frequency from the light beat signals by photoelectric conversion, and radiating the current to the space; light detection step for using the light beat signals as a probe light to detect reflected/transmitted waves of terahertz waves radiated in the terahertz wave generation step and produce a current having RF frequency components; and an analysis step for analyzing the RF frequency components.;SELECTED DRAWING: Figure 3;COPYRIGHT: (C)2018,JPO&INPIT
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