首页> 外国专利> PHYSICAL PROPERTY ANALYZER, METHOD FOR ANALYZING PHYSICAL PROPERTY, PHYSICAL PROPERTY ANALYSIS PROGRAM, AND PHYSICAL PROPERTY ANALYSIS SYSTEM

PHYSICAL PROPERTY ANALYZER, METHOD FOR ANALYZING PHYSICAL PROPERTY, PHYSICAL PROPERTY ANALYSIS PROGRAM, AND PHYSICAL PROPERTY ANALYSIS SYSTEM

机译:物性分析仪,物性分析方法,物性分析程序及物性分析系统

摘要

PROBLEM TO BE SOLVED: To provide an analyzer which can continuously capture the changes of the characteristics of a structure associated with passage of time based on vibration data detected from the structure.;SOLUTION: A physical property analyzer 70 includes: a vibration detector 10 for acquiring vibration data output from an inertia sensor set in a structure; and a controller 20 for extracting vibration data at each first period from the vibration data detected by the vibration detector 10, analyzing the analysis values based on the extracted pieces of vibration data, respectively, analyzing the distribution tendency of analysis values in a second period, which is larger than the first period, and calculating the indication value corresponding to the distribution tendency.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种分析器,该分析器可以基于从结构检测到的振动数据来连续捕获与时间的流逝相关的结构特征的变化。解决方案:物理性能分析器70包括:用于振动的检测器10获取从设置在结构中的惯性传感器输出的振动数据;控制器20,其用于从振动检测器10检测出的振动数据中提取出每个第一期间的振动数据,并基于提取出的振动数据分别分析分析值,并分析第二期间中的分析值的分布趋势。大于第一周期,并计算与分布趋势相对应的指示值。;选定的图纸:图1;版权:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2018119872A

    专利类型

  • 公开/公告日2018-08-02

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20170011878

  • 发明设计人 SATO KENTA;TAKEDA KAZUYOSHI;

    申请日2017-01-26

  • 分类号G01H17/00;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号