首页> 外国专利> LIQUID LEVEL HEIGHT MEASURING DEVICE, LIQUID INJECTING DEVICE HAVING LIQUID LEVEL HEIGHT MEASURING DEVICE, AND METHOD FOR MEASURING LIQUID LEVEL HEIGHT USING LEVEL HEIGHT MEASURING DEVICE

LIQUID LEVEL HEIGHT MEASURING DEVICE, LIQUID INJECTING DEVICE HAVING LIQUID LEVEL HEIGHT MEASURING DEVICE, AND METHOD FOR MEASURING LIQUID LEVEL HEIGHT USING LEVEL HEIGHT MEASURING DEVICE

机译:液位测量装置,具有液位测量装置的注液装置以及使用液位测量装置测量液位的方法

摘要

To contactlessly measure a change of liquid level in a transparent container with high accuracy without being affected by an environment or enable a change of liquid level in a transparent container to be measured contactlessly when there is difficulty bringing a sensor into direct contact with a liquid level because of the presence of a narrow part in a measurement path.SOLUTION: A liquid level height measuring device 50 measures a liquid level height in a container 30 by a change from a reference height. A length measuring instrument with laser interferometer 100 includes a laser light source, a beam splitter and a laser detector, and is capable of radiating a laser beam. A reflector 18 reflects the laser beam radiated from the length measuring instrument with laser interferometer at the underside of the container. The length measuring instrument with laser interferometer finds a liquid level height, as a change from the reference height, from a difference between the reference optical path length Lof the laser beam radiated from the laser light source and reflected from the reflector when the liquid level height in the container is at reference height and an optical path length Lx at the time the liquid level height is changed, and the refractive index of a liquid 34 under measurement that is included in the container during measurement.SELECTED DRAWING: Figure 2
机译:在不受环境影响的情况下高精度地无接触地测量透明容器中的液位变化,或者在难以使传感器直接与液位接触时,可以无接触地测量透明容器中的液位变化。解决方案:液位高度测量装置50通过从参考高度变化来测量容器30中的液位高度。带有激光干涉仪的长度测量仪100包括激光光源,分束器和激光检测器,并且能够发射激光束。反射器18在容器的下侧反射从具有激光干涉仪的长度测量仪发射的激光束。带有激光干涉仪的长度测量仪从液位高度时,从激光光源发射的激光束的参考光路长度L与反射器反射的反射光的参考光程长度L之差求出液位高度,作为与参考高度的变化容器中的液体处于参考高度,并且液位高度发生变化时的光程长度Lx,以及在测量过程中包含在容器中的被测液体34的折射率。图2

著录项

  • 公开/公告号JP2018169295A

    专利类型

  • 公开/公告日2018-11-01

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20170066936

  • 发明设计人 ONO YOSHIKI;

    申请日2017-03-30

  • 分类号G01F23/292;G01B11/02;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:44

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