首页> 外国专利> PHASE CHARACTERISTIC CALIBRATION SYSTEM AND PHASE CHARACTERISTIC CALIBRATION METHOD FOR MILLIMETER WAVE BAND SIGNAL MEASUREMENT CIRCUIT

PHASE CHARACTERISTIC CALIBRATION SYSTEM AND PHASE CHARACTERISTIC CALIBRATION METHOD FOR MILLIMETER WAVE BAND SIGNAL MEASUREMENT CIRCUIT

机译:毫米波带信号测量电路的相位特性标定系统和相位特性标定方法

摘要

PROBLEM TO BE SOLVED: To enable calibration of a phase characteristic of a millimeter wave band signal measurement circuit to be accurately performed.;SOLUTION: A calibration signal generating unit 40 generates a calibration signal Er which is obtained by frequency-synchronizing an electric harmonic signal of a frequency at an integer multiple of a repetition frequency of short pulse light P0 and combining a plurality of continuous waves of frequencies different within a frequency domain of a millimeter wave band. A calibration signal waveform acquisition unit 60 samples the calibration signal Er while changing a delay time of sampling light Ps by the sampling light to acquire a waveform of the calibration signal in a time domain. Phase information calculation means 70 calculates a phase of the plurality of continuous waves on the basis of the waveform of the calibration signal obtained for each change of the frequency of the continuous waves to determine a phase characteristic Δφ(f) of a calibration target within the frequency domain. A calibration processing unit 90 determines a phase characteristic ΔΦ(f) of a millimeter wave band signal measurement circuit 1 itself from a difference between the determined phase characteristic Δφ(f) and a phase characteristic ΔΦ(f)' measured at the millimeter wave band signal measurement circuit 1 with respect to the calibration signal Er.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2019,JPO&INPIT
机译:解决的问题:为了能够准确地进行毫米波信号测量电路的相位特性的校准。解决方案:校准信号生成单元40生成通过对谐波信号进行频率同步而获得的校准信号Er。将短脉冲光P0的重复频率的整数倍的频率的频率进行组合,并组合毫米波频带的频域内频率不同的多个连续波。校准信号波形获取单元60在通过采样光改变采样光Ps的延迟时间的同时采样校准信号Er,以获取时域中的校准信号的波形。相位信息计算装置70基于针对连续波的频率的每一次变化而获得的校准信号的波形,计算多个连续波的相位,从而求出校准对象物在其内部的相位特性Δφ(f)。频域。校准处理单元90根据所确定的相位特性Δφ(f)与在毫米波段处测量的相位特性ΔΦ(f)′之间的差来确定毫米波信号测量电路1本身的相位特性ΔΦ(f)。信号测量电路1相对于校准信号Er .;选择的图纸:图1;版权:(C)2019,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号