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Method and device for determining calibration parameters for metric calibration of a plenoptic camera
Method and device for determining calibration parameters for metric calibration of a plenoptic camera
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机译：确定用于全光摄像机的度量校准的校准参数的方法和设备
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摘要
The invention relates to a method and a device for determining calibration parameters for the metric calibration of a plenoptic camera. The method is characterized in that the plenoptic camera records at least one calibration pattern with known geometry from N different perspectives for generating image data sets BDi, TB and BDi, 2D with i = 1, 2,..., N and N ≥ 1 where BDi, TB are depth images respectively representing depth information v (Sx, Sy) at projection points Sx, Sy in the camera, and BDi, 2D are total focus images respectively representing brightness information at the projection points Sx, Sy in the camera; exclusively based on the image data sets BDi, 2D, the detector element size p and the known geometry of the calibration pattern having the features M, the following calibration parameters KP1 are determined: focal length f of the main lens L, and an optimally focused depth Czf (M) of projections of the geometric features M. of the calibration pattern within the camera, and based solely on the image data sets BDi, TB and the calibration parameters KP1, determining the following calibration parameters KP2: a distance h between a reference plane of the multi-lens array MLA and a reference plane of the main lens L, and determining a distance b between the reference plane of the multi-lens array MLA and a reference plane of the detector DET.
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