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XRD APPARATUS FOR IN-SITU OBSERVATION OF PHASE TRANSITIONS OF PIEZOELECTRIC POLYMER FILMS DURING STRETCHING XRD SYSTEM USING THEREOF
XRD APPARATUS FOR IN-SITU OBSERVATION OF PHASE TRANSITIONS OF PIEZOELECTRIC POLYMER FILMS DURING STRETCHING XRD SYSTEM USING THEREOF
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机译：XRD装置用于拉伸XRD系统中压电聚合物薄膜相变的原位观察。
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摘要
The present invention relates to a stretching apparatus for in-situ XRD for measuring phase transitions in real time with stretching applied to a piezoelectric polymer film such as a PVDF film. And at least one end of the piezoelectric polymer film is inserted and fixed so that tension can be applied to the sample and the sample is stretched by a specified elongation to be mounted on a device for measuring the phase transition of the sample A stretching device for measuring the phase transition according to the stretching of the piezoelectric polymer film can be provided. According to this, the phase transition due to the stretching of the piezoelectric polymer film can be measured in-situ.
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