首页> 外国专利> method for determining a path length deviation of a sample, and apparatus for determining a path length deviation of a sample

method for determining a path length deviation of a sample, and apparatus for determining a path length deviation of a sample

机译:用于确定样本的路径长度偏差的方法和用于确定样本的路径长度偏差的设备

摘要

A method for determining a trajectory length deviation of a sample, and apparatus for determining a trajectory length deviation for a sample, a method for determining a trajectory length deviation for a sample (610), wherein the method comprises: expose sample (610) to electromagnetic radiation in a plurality of wave numbers, determine electromagnetic absorption in sample (610) in plurality of wave numbers, determine a first wave number associated with a first absorption level of an absorption band and a second wave number associated with a second absorption band absorption level, wherein the second wave number is different from the first wave number, determining a difference between the first wave number and the second wave number and determining the path length deviation based on the difference. 1/1
机译:用于确定样本的轨迹长度偏差的方法和用于确定样本的轨迹长度偏差的设备,用于确定样本的轨迹长度偏差的方法(610),其中,该方法包括:将样本(610)暴露于多个波数的电磁辐射,确定多个波数的样品(610)中的电磁吸收,确定与吸收带的第一吸收水平相关的第一波数和与第二吸收带吸收相关的第二波数级别,其中第二波数与第一波数不同,确定第一波数与第二波数之间的差,并基于该差确定路径长度偏差。 1/1

著录项

  • 公开/公告号BR112015030064A2

    专利类型

  • 公开/公告日2017-07-25

    原文格式PDF

  • 申请/专利权人 FOSS ANALYTICAL A/S;

    申请/专利号BR20151130064

  • 发明设计人 PER WAABEN HANSEN;

    申请日2013-06-04

  • 分类号G01N21/27;G01J3/28;

  • 国家 BR

  • 入库时间 2022-08-21 13:39:59

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