首页>
外国专利>
method for determining a path length deviation of a sample, and apparatus for determining a path length deviation of a sample
method for determining a path length deviation of a sample, and apparatus for determining a path length deviation of a sample
展开▼
机译:用于确定样本的路径长度偏差的方法和用于确定样本的路径长度偏差的设备
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method for determining a trajectory length deviation of a sample, and apparatus for determining a trajectory length deviation for a sample, a method for determining a trajectory length deviation for a sample (610), wherein the method comprises: expose sample (610) to electromagnetic radiation in a plurality of wave numbers, determine electromagnetic absorption in sample (610) in plurality of wave numbers, determine a first wave number associated with a first absorption level of an absorption band and a second wave number associated with a second absorption band absorption level, wherein the second wave number is different from the first wave number, determining a difference between the first wave number and the second wave number and determining the path length deviation based on the difference. 1/1
展开▼