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Methods and Systems for Correcting X-Pessimism in Gate-Level Simulation or Emulation
Methods and Systems for Correcting X-Pessimism in Gate-Level Simulation or Emulation
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机译：在门级模拟或仿真中纠正X悲观主义的方法和系统
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摘要
Methods and systems are described to augment gate-level simulation with the ability to efficiently detect and correct X-pessimism on-the-fly. Using static Boolean analysis, gates are identified in the simulated hardware where there is potential for the simulator to propagate an X while the actual hardware propagates a 1 or 0, i.e. gates where X-pessimism potentially occurs. Data regarding potentially pessimistic gates is utilized in real time during simulation to determine actual pessimism at the gate and to correct it when it happens.;Whereas the understanding of X-pessimism and the method of augmenting simulation with attributes to correct X-pessimism in simulation on-the-fly is known in the public domain preceding known patents, various methods have been proposed recently to make on-the-fly X-pessimism correction more efficient for large ICs. The methods and systems described in the present invention, achieve new levels of performance and scalability of X-pessimism detection and correction.
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