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3D LOCALIZATION MICROSCOPY, 4D LOCALIZATION MICROSCOPY, TRACKING METHODS AND TRACKING SYSTEMS

机译:3D定位显微镜,4D定位显微镜,跟踪方法和跟踪系统

摘要

PROBLEM TO BE SOLVED: To provide an improved or at least alternative method of 3D localization microscopy.SOLUTION: A 3D localization microscopy system is configured to generate a phase difference between light traveling to or from one part of an objective lens and light traveling to or from another part of the objective lens in order to produce a point emitter image comprising two image lobes. In a position of an emitter, relative to the objective lens, that causes negative defocus, the two image lobes are separated from each other in first opposite directions substantially along an axis. In a position of the emitter, relative to the objective lens, that causes positive defocus, the two image lobes are separated from each other substantially along the axis in second opposite directions.SELECTED DRAWING: Figure 3
机译:解决的问题:提供一种改进的或至少替代性的3D定位显微镜方法。解决方案:3D定位显微镜系统配置为在进入或离开物镜一部分的光与进入或离开物镜的光之间产生相位差。为了产生包括两个图像波瓣的点发射器图像,从物镜的另一部分发射光。在相对于物镜的导致负散焦的发射器位置中,两个像瓣在基本上沿着轴线的第一相反方向上彼此分离。在发射器相对于物镜的位置上,导致物镜正向散焦,这两个图像波瓣沿第二相反方向基本上沿轴彼此分离。图3

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