首页> 外国专利> THERMAL SHRINKAGE MEASUREMENT METHOD OF GLASS SUBSTRATE AND THERMAL SHRINKAGE MEASUREMENT DEVICE, AND MANUFACTURING METHOD OF GLASS SUBSTRATE

THERMAL SHRINKAGE MEASUREMENT METHOD OF GLASS SUBSTRATE AND THERMAL SHRINKAGE MEASUREMENT DEVICE, AND MANUFACTURING METHOD OF GLASS SUBSTRATE

机译:玻璃基质的热收缩测量方法和热收缩测量装置,以及玻璃基质的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a highly accurate thermal shrinkage measurement method by suppressing a measurement fluctuation of the thermal shrinkage for measuring the thermal shrinkage of a glass substrate having a high dimension accuracy.;SOLUTION: A thermal shrinkage measurement method includes: a step of cutting out the predetermined number of measurement substrates from a glass substrate; a step of attaching Vickers indentations (indentation A and indentation B) on the principal surface of a measurement substrate; and a length measurement step of measuring a distance X between a measurement point A and a measurement point B specified by each of the indentation A and the indentation B by a prior heat treatment (distance X0) and an after treatment (distance X1). In the Vickers indentation application step, each of the measurement substrate is inputted with the Vickers indentation in which the indentation distance of the indentations A-B is the same with each other. In a length measurement step, the indentations A and B are enlarged so as to acquire a cruciform image, and a cruciform contour is determined based on the image process. Measurement points (measurement points A and B) are specified in the cruciform contour, and after going through the prior thermal process and the after thermal process, the coordinate positions (x and y) of the measurement points A and B are calculated so as to measure the distance X0 and the distance X1, thereby acquiring the thermal shrinkage of the glass substrate.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:通过抑制热收缩的测量波动来提供高精度的热收缩测量方法,以测量具有高尺寸精度的玻璃基板的热收缩。从玻璃基板切出预定数量的测量基板的步骤;在测量基板的主面上安装维氏压痕(压痕A和压痕B)的步骤;长度测量步骤,其通过预先热处理测量由压痕A和压痕B分别指定的测量点A与测量点B之间的距离X(距离X 0 )和治疗后(距离X 1 )。在维氏压痕施加步骤中,向每个测量基板输入维氏压痕,其中,压痕A-B的压痕距离彼此相同。在长度测量步骤中,将凹痕A和B放大以获取十字形图像,并且基于图像处理确定十字形轮廓。在十字形轮廓中指定测量点(测量点A和B),并在经过先前的热处理和之后的热处理之后,计算出测量点A和B的坐标位置(x和y),以便测量距离X 0 和距离X 1 ,从而获得玻璃基板的热收缩率。;选图:图2;版权:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2017181388A

    专利类型

  • 公开/公告日2017-10-05

    原文格式PDF

  • 申请/专利权人 AVANSTRATE INC;

    申请/专利号JP20160071480

  • 发明设计人 NAKAMURA ATSUSHI;

    申请日2016-03-31

  • 分类号G01N25/16;

  • 国家 JP

  • 入库时间 2022-08-21 13:59:19

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