首页> 外国专利> ANALYSIS SAMPLE PREPARATION METHOD OF AUGER ELECTRON SPECTROSCOPIC ANALYSIS AND AUGER ELECTRON SPECTROSCOPIC ANALYSIS METHOD

ANALYSIS SAMPLE PREPARATION METHOD OF AUGER ELECTRON SPECTROSCOPIC ANALYSIS AND AUGER ELECTRON SPECTROSCOPIC ANALYSIS METHOD

机译:俄歇电子光谱分析的分析样品制备方法和俄歇电子光谱分析方法

摘要

PROBLEM TO BE SOLVED: To provide an analysis sample preparation method capable of alternately laminating a conductive body sheet and a mixture containing powder samples having different compositions to simply and effectively suppress a charge phenomenon and efficiently enable Auger electron spectroscopic analysis.SOLUTION: An analysis sample preparation method includes: a mixture preparation step S1 of mixing powder samples having difference compositions with resin respectively, to obtain a mixture for each powder sample having a different composition; a lamination step S2 of, after applying any one of the plurality of mixture on one conductive body sheet, repeatedly mounting the other conductive body sheets on the applied mixture, alternately laminating the conductive body sheets and the mixtures, and making a lower most layer and an uppermost layer into the conductive body sheet to obtain a laminate; and a cross section machining step S3 of forming a cross section to the lamination direction of the laminate.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种分析样品制备方法,该方法能够交替地层压导电体片和包含具有不同组成的粉末样品的混合物,以简单有效地抑制电荷现象并有效地进行俄歇电子能谱分析。制备方法包括:混合物制备步骤S1,将具有不同组成的粉末样品分别与树脂混合,以得到每种具有不同组成的粉末样品的混合物;层压步骤S2,在将多种混合物中的任何一种涂覆在一个导电体片上之后,将另一导电体片重复地安装在所涂覆的混合物上,交替地层压导电体片和混合物,并制成最下层,在导电体片中的最上层以获得层压体;图1是在层压件的层压方向上形成横截面的横截面加工步骤S3。

著录项

  • 公开/公告号JP2017187283A

    专利类型

  • 公开/公告日2017-10-12

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL MINING CO LTD;

    申请/专利号JP20160073820

  • 发明设计人 KITAZATO TOMOKO;

    申请日2016-04-01

  • 分类号G01N23/227;G01N23/22;

  • 国家 JP

  • 入库时间 2022-08-21 14:01:45

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