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The outside dimensional - measuring instrument, the outside dimensional - measuring method and computer program product

机译:外形尺寸测量仪器,外形尺寸测量方法及计算机程序产品

摘要

An externally dimensional - measuring device includes a light source; an optical system, consisting of the light emitted by the light source is focused on an optical axis; a reflector which reflects the focused light; a detector, which detects an intensity of the reflected light; and a computing device in which an external dimension of a measured object using a first focus position, a second focus position and a position of the reflector on the optical axis is calculated, wherein the first focus position is located on the optical axis, where a tip in a light intensity reflected by the detector for light is detected, which is reflected by a first surface, and wherein the second focus position is located on the optical axis, where a tip in a light intensity reflected by the detector for light is detected, which is reflected by the reflector and at a second surface was emitted.
机译:外部尺寸测量装置包括光源;由光源发出的光组成的光学系统聚焦在光轴上。反射器,其反射聚焦的光;检测器,其检测反射光的强度;以及计算装置,其中计算使用第一焦点位置,第二焦点位置和反射器在光轴上的位置的被测物体的外部尺寸,其中第一焦点位置位于光轴上,其中探测由光检测器反射的光强度的尖端,该尖端被第一表面反射,并且其中第二焦点位置位于光轴上,在该光轴上,检测由光检测器反射的光强度的尖端。被反射器反射并在第二表面发射。

著录项

  • 公开/公告号DE102015009471A1

    专利类型

  • 公开/公告日2016-02-11

    原文格式PDF

  • 申请/专利权人 MITUTOYO CORPORATION;

    申请/专利号DE20151009471

  • 发明设计人 YUTAKA MIKI;

    申请日2015-07-22

  • 分类号G01B11/02;G01B11/14;G01B11/08;

  • 国家 DE

  • 入库时间 2022-08-21 14:09:33

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