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System to measure lattice parameter, especially on single crystal samples and polycrystalline materials

机译：用于测量晶格参数的系统，尤其是在单晶样品和多晶材料上

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This system contains a holder (2) to attach the analysed sample (1) over which the source (4) of X -ray radiation is placed on the first rotary arm (3).In addition, the system contains a second rotating shoulder (6) for positioning a proportional point detector (9), which has the same centre of rotation as its first rotating shoulder (3).Parallel Soller shades (7) are placed on the second rotating shoulder (6) in the direction of radiation diffused from the analysed sample (1) in combination with a modifiable monochromator.The modifiable monochromator is made up of a preparation (8), which is placed behind Soller's curtains (7) and is attached to the other rotary shoulder (6) by means of a clamp holder (8.2).The preparation (8) is equipped with a transverse axis (x) with a placeable holder (8.3) in which the proportional point detector (9) is located. At the base (8.1) the product (8) is placed in the height of the axis (z) of the placeable holder (8.4) in which the goniometer (8.5) with the interchangeable monochromatizing crystal (8.6) is stored. This goniometer (8.5) is tiltable in the plane perpendicular to the goniometer axis (8.5) in the range.+-. 15.degree., with the axes of parallel Soller clones (7) and goniometer (8.5) at 65.degree.
机译：该系统包含一个用于固定分析样品（1）的支架（2），X射线辐射源（4）放在其上的第一旋转臂（3）上。 6）用于定位比例点检测器（9），其旋转中心与其第一旋转肩部（3）相同。平行Soller阴影（7）沿辐射扩散方向放置在第二旋转肩部（6）上由可分析的样品（1）与可修改的单色仪组合而成。可修改的单色仪由制剂（8）制成，该制剂放在Soller窗帘（7）的后面，并通过以下方式连接到另一个旋转台肩（6）：夹具（8.2）。制剂（8）的横轴（x）带有可放置的夹具（8.3），比例点检测器（9）位于其中。在基座（8.1）上，将产品（8）放置在可放置支架（8.4）的轴（z）的高度上，其中存储了带有可互换单色化晶体（8.6）的测角计（8.5）。该测角计（8.5）在垂直于测角计轴（8.5）的范围内的范围内可倾斜。 15度，平行Soller克隆（7）和测角计（8.5）的轴位于65度。

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