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The mechanism and interface of access to structural and functional testing of integrated circuits, mixed and processes of structural and functional testing of integrated circuits with mixed

机译：进入集成电路结构和功能测试，混合以及进入集成电路结构和功能测试的过程的机制和接口

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Summary the mechanism and interface of access to structural and functional testing of integrated circuits and processes mixed structural test and functional mixed integrated circuits, the present invention belongs to the technical field of microelectronics and refers more specifically to the area Testing of integrated circuits.Generally, the present invention provides structural and functional testing of integrated circuits, mixed (analog and digital) via an interface for only three pins. The proposed solution allows trafegarem both mixed signal (analog and / or digital), as a digital only.They are also proposed by the invention processes of structural test and functional mixed integrated circuits.

机译：概述了集成电路结构和功能测试以及混合结构测试和功能混合集成电路的访问机制和接口，本发明属于微电子技术领域，更具体地涉及集成电路测试领域。本发明通过仅三个管脚的接口提供了混合（模拟和数字）集成电路的结构和功能测试。所提出的解决方案只允许trafegarem混合信号（模拟和/或数字）仅作为数字。它们也是结构测试和功能混合集成电路的发明过程所提出的。

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公开/公告号BR102014021296A2

专利类型
公开/公告日2016-04-19

原文格式PDF
申请/专利权人 CENTRO NACIONAL DE TECNOLOGIA ELETRÔNICA AVANÇADAS.A.;
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申请/专利号BR20141021296
发明设计人 JULIO LEÃO DA SILVA JUNIOR;SANDRO TOMASSONI COELHO;DOUGLAS CAMARGO FOSTER;ALFREDO OLMOS;ANTONIO AUGUSTO GIACOMELLI DE OLIVEIRA;EMERSON ROSSETTO CAMARGO;MARCELO SOARES LUBASZEWSKI;
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申请日2014-08-28
分类号G01R31/3167;
国家 BR
入库时间 2022-08-21 14:27:08

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