Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen

• 1. 用于以原本状态观察生物试样的利用电子显微镜的观察方法、以及用于该方法的真空下的蒸发抑制用组合物、扫描电子显微镜及透射电子显微镜 [P] . 中国专利： CN103843106A . 2014-06-04
• 2. 电子显微法的观察样品、电子显微法、电子显微镜以及观察样品制作装置 [P] . 中国专利： CN103907004B . 2016.10.26
• 3. OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICROSCOPY, ELECTRON MICROSCOPE, AND DEVICE FOR PRODUCING OBSERVATION SPECIMEN [P] . 美国专利： US2014264018A1 . 2014-09-18

  机译： 用于电子显微镜，电子显微镜，电子显微镜和用于产生观察标本的装置的观察标本

• 4. OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICROSCOPY, ELECTRON MICROSCOPE, AND DEVICE FOR PRODUCING OBSERVATION SPECIMEN [P] . 世界知识产权组织专利： WO2013065475A1 . 2013-05-10

  机译： 用于电子显微镜，电子显微镜，电子显微镜和用于产生观察标本的装置的观察标本

• 5. Electron microscopy, electron microscope and observation specimen preparation device [P] . 日本专利： JP5951223B2 . 2016-07-13

  机译： 电子显微镜，电子显微镜和观察标本制备装置

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• 6. THREE-DIMENSIONAL OBSERVATIONS ON THICK BIOLOGICAL SPECIMENS BY HIGH VOLTAGE ELECTRON MICROSCOPY [J] . Tetsuji Nagata Image analysis and stereology . 2011,第1期
• 7. Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes [C] . R M Langford, D Ozkaya, B Huey, Royal Microscopical Society Conference, Mar 25-29, 2001, Oxford University . 2001
• 8. III-V compound semiconductor material characterization of microstructures and nanostructures on various optoelectronic devices with analytical transmission electron microscopy and high resolution electron microscopy . [D] . Zhou, Wei. 2004
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• 10. Progress of Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA) for Pulp and Paper Specimens. (Part II). Observation at High Magnification by Using Field Emission-SEM (FE-SEM) and Atomic Force Microscope (AFM). [O] . Tadahira Hamada 1999
• 11. Preparation of Mica Specimen Support Films for Electron Microscopy and Radiation Damage Induced by High-Energy Electron Bombardment, [R] . spitzer,hermann j. 1971

• 1. Scanning Electron Microscopy Observation of Adhesion Properties of iBifidobacterium/iilongum/iW11 and Chromatographic Analysis of Its Exopolysaccaride [J] . Rosanna Inturri ,Aldo Stivala ,Fulvia Sinatra . 食品与营养科学（英文） . 2014,第18期
• 2. In situ scanning electron microscopy observation of deformation and fracture behavior of Ti-3Zr-2Sn-3Mo-25Nb alloy [J] . Ma Xiqun ,Yu Zhentao ,Han Yong . 稀有金属：英文版 . 2012,第4期
• 3. 粘土矿物电子显微镜观察及样品制备 [C] . 黄建国 . 首届全国青年地质工作者学术会 . 1987
• 4. 用于超快电子显微镜的光阴极微波电子枪的研制 [A] . 陈婷珏 . 2020