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Process and system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters
Process and system for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters
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机译：使用第一局部可测量的回路特性和第一组参数来校准第一回路特征值估计方法的过程和系统
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摘要
A process for calibrating a first loop feature value estimation method using a first locally measurable loop characteristic and a first set of parameters, includes taking measurements of the first locally measurable loop characteristic for a plurality of loops, and obtaining a reference data set representing reference estimates of the loop feature value. The reference estimates are obtained by performing a calibrated second loop feature value estimation method using a second locally measurable loop characteristic and a second set of parameters. The method further includes determining calibrated parameters so as to minimize a deviation between the reference estimates and estimates obtained by applying the first estimation method to the measurements using the calibrated parameters as the first set of parameters.
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