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INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPE AND PROCESS FOR INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPY
INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPE AND PROCESS FOR INTERMITTENT CONTACT RESONANCE ATOMIC FORCE MICROSCOPY
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机译：间歇接触共振原子力显微镜及间歇接触共振原子力显微镜的过程
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摘要
An intermittent contact atomic force microscope includes: a cantilever configured to receive a contact resonance modulation; a sample disposed proximate to the cantilever; a contact resonance modulator in communication with the cantilever and configured to provide the contact resonance modulation to the cantilever; and a scan modulator in mechanical communication with the sample to provide a scan modulation to the sample. Also disclosed is a process for performing intermittent contact atomic force microscopy, the process includes: providing a dual modulation microscope including: a cantilever configured to receive a contact resonance modulation; a sample disposed proximate to the cantilever; a contact resonance modulator in communication with the cantilever and configured to provide the contact resonance modulation to the cantilever; and a scan modulator in mechanical communication with the sample to provide a scan modulation to the sample; subjecting the cantilever to the contact resonance modulation; modulating the cantilever at a contact resonance frequency; subjecting the sample to the scan modulation; and modulating the sample at a scan modulation frequency to perform intermittent contact atomic force microscopy.
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