首页> 外国专利> METHOD FOR CALCULATING AN INDENTER AREA FUNCTION AND QUANTIFYING A DEVIATION FROM THE IDEAL SHAPE OF AN INDENTER

METHOD FOR CALCULATING AN INDENTER AREA FUNCTION AND QUANTIFYING A DEVIATION FROM THE IDEAL SHAPE OF AN INDENTER

机译:计算指标区域功能并从指标的理想形状量化偏差的方法

摘要

A method for calculating an indenter area function and quantifying a deviation from the ideal shape of an indenter. The method preferably comprises the steps of: (1) providing a material testing apparatus, an indenter, and a sample; (2) performing one (or very few indentation tests) across a range of loads by applying the indenter to the sample; (3) collecting load data; (4) calculating Martens hardness data (5) normalizing the depth data and Martens hardness data; and (6) analyzing the load data to detect the amount of deviation in the indenter's area function. Preferably, when applying the indenter to the sample, the loading rate will be performed very slowly at low loads. The loading rate will then preferably accelerate as the load increases. This will generally allow the load application tester to produce repeatable data at low loads and a full range test in a reasonably short time.
机译:一种用于计算压头面积函数并量化与压头理想形状的偏差的方法。该方法优选地包括以下步骤:(1)提供材料测试设备,压头和样品; (2)通过将压头施加到样品上,在一系列载荷下进行一次(或很少的压痕测试); (3)收集负荷数据; (4)计算马氏硬度数据;(5)归一化深度数据和马氏硬度数据; (6)分析载荷数据以检测压头面积函数的偏差量。优选地,当将压头施加到样品上时,加载速率将在低负载下非常缓慢地执行。然后,负载率将优选随着负载的增加而加速。通常,这将使负载应用程序测试人员可以在低负载下生成可重复的数据,并在相当短的时间内进行全范围测试。

著录项

  • 公开/公告号US2016282249A1

    专利类型

  • 公开/公告日2016-09-29

    原文格式PDF

  • 申请/专利权人 NANOVEA INC.;

    申请/专利号US201514670175

  • 发明设计人 PIERRE LEROUX;FERNANDO VALENZUELA;

    申请日2015-03-26

  • 分类号G01N3/42;G01N3/02;

  • 国家 US

  • 入库时间 2022-08-21 14:36:23

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