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DETERMINING CORRELATION COEFFICIENT(S) AMONG DIFFERENT FIELD EFFECT TRANSISTOR TYPES AND/OR AMONG DIFFERENT ELECTRICAL PARAMETER TYPES
DETERMINING CORRELATION COEFFICIENT(S) AMONG DIFFERENT FIELD EFFECT TRANSISTOR TYPES AND/OR AMONG DIFFERENT ELECTRICAL PARAMETER TYPES
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机译：确定不同场效应晶体管类型和/或不同电参数类型之间的相关系数
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摘要
A system, method and computer program product for determining correlation coefficient(s) among different field effect transistor types for a same electrical parameter type and/or among different electrical parameter types for a same field effect transistor type. The correlation coefficient(s) are determined based on the results of a limited number of simulation runs. Specifically, the number of simulation runs required by the disclosed embodiments is limited to one plus the product of the number of different field effect transistor types at issue, the number of different electrical parameter types at issue and the number of statistical process parameter types that impact the different electrical parameter types. Such correlation coefficient(s) can subsequently be used to develop a compact model of a semiconductor process technology. This compact model can then be used to perform variation-aware design of an integrated circuit chip.
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