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Equivalent circuit analysis device and an equivalent circuit analysis method

机译:等效电路分析装置及等效电路分析方法

摘要

PROBLEM TO BE SOLVED: To calculate respective parameters of an equivalent circuit through analysis with high precision.SOLUTION: When plot curve generation processing for generating a Nyquist plot curve A, fitting processing for calculating a semicircle B corresponding to an arcuate area W of the curve A, and capacity calculation processing for calculating a capacity component constituting an equivalent circuit on the basis of real-number component values R1, R2 at contacts P1, P2 between the semicircle B and a lateral axis and a frequency fc at an intersection P3 of the semicircle B and a straight line L1 are performed, frequency calculation processing is executed in which a frequency variation quantity is calculated by dividing a difference in frequency between a pair of specific plots Pa, Pb where a real-number component value is nearly equal to a real-number component value at the intersection P3 by a difference value (Rb-Ra) between those real-number component values, and a multiplication value obtained by multiplying the difference value between the real-number component value Rb on one specific plot Pb and the real-number component value at the intersection P3 by the frequency variation quantity and a frequency fb of the specific plot Pb are added together.
机译:解决的问题:要通过高精度分析来计算等效电路的各个参数解决方案:当生成Nyquist图曲线A的图曲线生成处理时,用于计算与曲线的弧形区域W相对应的半圆B的拟合处理A,以及用于基于在半圆B和横轴之间的触点P1,P2处的实数分量值R1,R2以及在交点P3处的频率fc来计算构成等效电路的电容分量的电容计算处理。执行半圆B和直线L1,执行频率计算处理,其中通过将实数分量值几乎等于a的一对特定曲线Pa,Pb之间的频率差除以计算频率变化量。交点P3处的实数分量值减去这些实数分量值之间的差值(Rb-Ra),然后乘以通过将一个特定曲线Pb上的实数分量值Rb与交点P3处的实数分量值之差值乘以特定曲线Pb的频率变化量和频率fb而获得的求和值相加。

著录项

  • 公开/公告号JP5912884B2

    专利类型

  • 公开/公告日2016-04-27

    原文格式PDF

  • 申请/专利权人 日置電機株式会社;

    申请/专利号JP20120126815

  • 发明设计人 田中 秀明;春原 雅志;

    申请日2012-06-04

  • 分类号G01R27/02;G01R31/36;

  • 国家 JP

  • 入库时间 2022-08-21 14:39:52

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