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SYMPTOM DIAGNOSIS SYSTEM, SYMPTOM DIAGNOSIS METHOD, AND SYMPTOM DIAGNOSIS DEVICE

机译:症状诊断系统,症状诊断方法和症状诊断装置

摘要

PROBLEM TO BE SOLVED: To provide a symptom diagnosis system capable of properly predicting and diagnosing an inspection time of equipment.;SOLUTION: A symptom diagnosis system 100 comprises: cluster set creation means (cluster set creation part 22) for creating a cluster set in which a feature amount is extracted from pieces of accumulation data of measurement values of inspection target equipment 10 and plural pieces of equipment 11 whose kinds are same to the kind of the target equipment; abnormality calculation means (abnormality calculation part 23) for calculating abnormality on the basis of the created cluster set and the measurement value of the target equipment; cluster selection means (cluster selection part 24) for selecting a cluster which is used for predicting the inspection time of the target equipment, from the cluster set, on the basis of the calculated abnormality; and inspection time prediction means (inspection time prediction part 25) for predicting the inspection time of the target equipment on the basis of the prediction value and a predetermined threshold, after calculating the prediction value of the equipment state of the target equipment on the basis of the selected cluster.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种能够正确地预测和诊断设备的检查时间的症状诊断系统。解决方案:症状诊断系统100包括:用于在其中创建群集集的群集集创建装置(群集集创建部件22)。从检查对象设备10和种类与对象设备的种类相同的多个设备11的测量值的累积数据中提取特征量;异常计算装置(异常计算部23),用于基于所生成的簇集和目标设备的测量值来计算异常;群集选择装置(群集选择部24),根据计算出的异常,从群集组中选择用于预测对象设备的检查时间的群集。检查时间预测装置(检查时间预测部25),用于在基于所述预测值和预定阈值计算目标设备的设备状态的预测值之后,预测目标设备的检查时间。选定的群集。;选定的图纸:图1;版权:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2016157206A

    专利类型

  • 公开/公告日2016-09-01

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20150033346

  • 发明设计人 NASU SHINGO;IIBOSHI YOICHI;FURUYA SATORU;

    申请日2015-02-23

  • 分类号G05B23/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:47:12

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