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ANALOG SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY MEASUREMENT DEVICE AND MATERIAL TESTER
ANALOG SIGNAL PROCESSING CIRCUIT, PHYSICAL QUANTITY MEASUREMENT DEVICE AND MATERIAL TESTER
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机译：模拟信号处理电路，物理量测量装置和材料测试仪
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摘要
PROBLEM TO BE SOLVED: To cancel fluctuation of DC offset voltage of an operational amplifier used in an instrumentation amplifier or low-pass filter, in a circuit that processes an input signal from a sensor part for performing differential output to voltage based on change of a physical quantity measured in material test.;SOLUTION: A signal processing part 60 has a processing system A and a processing system B that are designed at the same circuit constant. Outputs of the processing system A comprising an instrumentation amplifier 61a configured to amplify output from a first terminal 51 of a bridge circuit of a sensor 50 and output it and a low-pass filter 62a continuing to the instrumentation amplifier and the processing system B comprising an instrumentation amplifier 61b configured to amplify output from a second terminal 52 and output it and a low-pass filter 62 are input to a perfect differential type AD converter 63, and thereby fluctuation of DC offset voltage is cancelled.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2016,JPO&INPIT
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