X-RAY DIFFRACTION MICROSCOPE AND X-RAY DIFFRACTION MEASUREMENT METHOD USING X-RAY DIFFRACTION MICROSCOPE

• 1. X射线衍射装置和X射线衍射测定方法 [P] . 中国专利： CN105593670B . 2019.06.04
• 2. X射线衍射装置和X射线衍射测定方法 [P] . 中国专利： CN105593670A . 2016-05-18
• 3. X-RAY DIFFRACTION MICROSCOPE AND X-RAY DIFFRACTION MEASUREMENT METHOD USING X-RAY DIFFRACTION MICROSCOPE [P] . 欧洲知识产权局专利： EP1672361A4 . 2010-12-29

  机译： X射线衍射显微镜及使用X射线衍射显微镜的X射线衍射测定方法

• 4. X-RAY DIFFRACTION MICROSCOPE AND X-RAY DIFFRACTION MEASUREMENT METHOD USING X-RAY DIFFRACTION MICROSCOPE [P] . 欧洲知识产权局专利： EP1672361A1 . 2006-06-21

  机译： X射线衍射显微镜及使用X射线衍射显微镜的X射线衍射测定方法

• 5. The X-ray diffraction measurement method by X-ray diffraction microscope apparatus and X-ray diffraction microscope apparatus [P] . 日本专利： JP3834652B2 . 2006-10-18

  机译： X射线衍射显微镜装置及X射线衍射显微镜装置的X射线衍射测定方法

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• 3. Raman Microspectroscopy as a Valuable Additional Method to X-ray Diffraction and Electron Microscope/Microprobe Analysis in the Study of Iron Arsenates in Environmental Samples [J] . MICHAL FILIPPI, VLADIMIR MACHOVIC, PETR DRAHOTA, Applied Spectroscopy: Society for Applied Spectroscopy . 2009,第6期
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• 7. The Method of Testing for Asbestos in Electronic and Electric Products through Polarizing Microscope and X-Ray Diffraction [O] . Hongwei Wang, Jun Liu, Qiang Ma, 2019
• 8. ON THE REACTIVITY OF URANOURAN IC,nOXIDE(Ⅳ) Study of the Surface Structure of Uranourdnic Oxide "Powder by Electron Microscope-Replica Method and X-Ray diffraction /Method [R] . Rokuo Ukaji 1962

• 1. The Method of Testing for Asbestos in Electronic and Electric Products through Polarizing Microscope and X-Ray Diffraction [J] . Hongwei Wang ,Jun Liu ,Qiang Ma . 电力能源（英文） . 2019,第11期
• 2. Residual stress measurement of coarse-grain aluminum alloy using X-ray diffraction method [J] . Sun Jiantong ,Li Xiaoyan ,Zhang Liang . 中国焊接 . 2016,第002期
• 3. Application of methods of X-ray diffraction analysis and acoustic emission on research of plastic deformation in steels [J] . KORCHEVSKII Vyacheslav ,RI Hosen . 稀有金属：英文版 . 2007,第S1期
• 4. APPLICATION OF THE MOMENT METHODS TO ANALYSIS OF X-RAY DIFFRACTION LINE PROFILE FOR PA1010-BMI SYSTEM [J] . 张宏放 ,于力 ,张利华 . 高分子科学：英文版 . 1995,第3期
• 5. Dependence of Microstucture on Errors in X-Ray Diffraction Profile Measurement [J] . Zeljko Skoko ,Stanko Popovi ,Goran Stefanic . 材料科学与工程：中英文A版 . 2013,第010期
• 6. 弹簧材料X射线衍射残余应力测试方法研究兼述材料组织结构强化的X射线衍射分析 [C] . 吕克茂 ,吕东艳 . 第十四届全国弹簧学术会、第十二届全国弹簧失效分析讨论会暨第八届海峡两岸弹簧专业研讨会 . 2012
• 7. 原位X射线衍射技术研究聚丁烯--1晶型Ⅱ到晶型Ⅰ转变动力学及机理 [A] . 杨小康 . 2021