首页> 外国专利> RAMAN SPECTROSCOPY SYSTEM USING METAL NANOPARTICLES, SCANNING PROBE MICROSCOPE, AND METHOD FOR MEASURING DEPENDENCE OF POLARIZED LIGHT IN NANOSCALES

RAMAN SPECTROSCOPY SYSTEM USING METAL NANOPARTICLES, SCANNING PROBE MICROSCOPE, AND METHOD FOR MEASURING DEPENDENCE OF POLARIZED LIGHT IN NANOSCALES

机译:使用金属纳米粒子,扫描探针显微镜的拉曼光谱系统以及测量纳米粒子中偏光的相关性的方法

摘要

The present invention provides a tip-enhanced raman spectroscopy system using metal nanoparticles, a microscope using the same, and a measurement method thereof. The microscope comprises: a probe arranged close to an object to be measured, and having a metal tip; a light source for irradiating light to the probe; metal nanoparticles distributed on the top surface or the bottom surface of the object to be measured to increase an electromagnetic field generated by the light between the object and the probe, or an auxiliary probe arranged close to the probe to increase the electromagnetic field between the object and the probe; a light collection part for collecting signals radiated from the object to be measured; and a detection part for detecting the raman spectrum of the collected signals. The electromagnetic field is concentrated between the probe and the nanoparticles to strength raman spectroscopic signals and increase nanometer spatial resolving power.;COPYRIGHT KIPO 2015
机译:本发明提供了使用金属纳米粒子的尖端增强拉曼光谱系统,使用该纳米系统的显微镜及其测量方法。该显微镜包括:探针,被布置为靠近要测量的对象并且具有金属尖端;用于向探头辐射光的光源;金属纳米粒子分布在要测量的对象的顶面或底面上,以增加由对象和探针之间的光产生的电磁场,或布置在探针附近的辅助探针,以增加对象之间的电磁场和探针;集光部,用于收集从被测定物放射的信号。检测部分,用于检测所收集信号的拉曼光谱。电磁场集中在探针和纳米颗粒之间,以增强拉曼光谱信号并提高纳米空间分辨能力。; COPYRIGHT KIPO 2015

著录项

  • 公开/公告号KR20140135018A

    专利类型

  • 公开/公告日2014-11-25

    原文格式PDF

  • 申请/专利号KR20130055232

  • 发明设计人 YANG IN SANGKR;

    申请日2013-05-15

  • 分类号G01N21/65;G01J3/44;G01Q70/00;

  • 国家 KR

  • 入库时间 2022-08-21 15:01:31

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