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Integrated circuit to operate in an area of ionizing radiation, and having an output for a radiation dose-dependent way damage information, and alarm indicators and corresponding method

机译:在电离辐射区域中操作并具有用于辐射剂量相关方式的损伤信息的输出的集成电路,警报指示器和相应的方法

摘要

An integrated circuit, in particular a microcontroller, for operation in an area with ionizing radiation, has at least one part of a temperature control circuit. The temperature control circuit performs a regulated increase in the circuit temperature to a predefined, essentially constant operating temperature, by increasing the electrical power consumption of the circuit by an adjustable additional electrical power. The circuit has an output facility for information about damage to the integrated circuit caused by the ionizing radiation impacting thereon, it being possible to determine the information about damage from a radiation-dose-dependent decrease in the adjustable additional electrical power.
机译:用于在具有电离辐射的区域中操作的集成电路,尤其是微控制器,具有温度控制电路的至少一部分。温度控制电路通过以可调节的附加电功率增加电路的电功率消耗来将电路温度调节地升高到预定的,基本上恒定的工作温度。该电路具有输出设备,用于输出有关因电离辐射撞击集成电路而引起的集成电路损坏的信息,可以确定与辐射剂量相关的可调附加电功率下降所致的损坏信息。

著录项

  • 公开/公告号US9030328B2

    专利类型

  • 公开/公告日2015-05-12

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号US201213655029

  • 发明设计人 HANS AEBERSOLD;

    申请日2012-10-18

  • 分类号G08B17/10;G08B17/103;G08B29;H01L23/34;

  • 国家 US

  • 入库时间 2022-08-21 15:21:38

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