首页> 外国专利> APPARATUS FOR MEASURING RESPONSE TIME, SYSTEM FOR MEASURING RESPONSE TIME AND METHOD FOR MEASURING RESPONSE TIME

APPARATUS FOR MEASURING RESPONSE TIME, SYSTEM FOR MEASURING RESPONSE TIME AND METHOD FOR MEASURING RESPONSE TIME

机译:响应时间的测量装置,响应时间的测量系统和响应时间的测量方法

摘要

Example embodiments relate to a response time measurement apparatus, a response time measurement system and a response time measurement method for measuring a response output time from a facility corresponding to an input signal, and more particularly, a response time measurement apparatus, a response time measurement system and a response time measurement method in which the output display of a facility is captured through a capture device to detect an output time on the basis thereof.
机译:示例实施例涉及用于测量来自与输入信号相对应的设备的响应输出时间的响应时间测量设备,响应时间测量系统和响应时间测量方法,并且更具体地,涉及响应时间测量设备,响应时间测量。该系统和响应时间测量方法,其中通过捕获设备捕获设施的输出显示,以基于该设备检测输出时间。

著录项

  • 公开/公告号US2015088460A1

    专利类型

  • 公开/公告日2015-03-26

    原文格式PDF

  • 申请/专利权人 SAM WON LEE;

    申请/专利号US201414478164

  • 发明设计人 SAM WON LEE;

    申请日2014-09-05

  • 分类号G04F10;

  • 国家 US

  • 入库时间 2022-08-21 15:23:24

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