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ULTRASONIC THICKNESS MEASUREMENT METHOD AND ULTRASONIC THICKNESS MEASUREMENT SYSTEM

机译:超声波厚度测量方法和超声波厚度测量系统

摘要

PROBLEM TO BE SOLVED: To provide an ultrasonic thickness measurement method and an ultrasonic thickness measurement system capable of easily measuring a thickness after a second layer of a multi-layered structure material in a case where ultrasonic echo of a measurement object layer is overlapped with multiple reflection echo of a former layer.;SOLUTION: An ultrasonic thickness measurement method for measuring a thickness of each layer of a multi-layered structure material in which at least two or more different materials are laminated with an ultrasonic echo method, measures the thickness after the second layer by actively changing the temperature of the multi-layered structure material and utilizing the fact that the way of overlapping of the measurement object layer on the multiple reflection echo of the former layer changes due to the temperature.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种超声波厚度测量方法和超声波厚度测量系统,该方法和超声波厚度测量系统能够在测量对象层的超声波回波与多个重叠的情况下容易地测量第二层多层结构材料之后的厚度。解决方案:一种超声厚度测量方法,用于测量多层结构材料的每一层的厚度,其中至少两种或多种不同的材料通过超声回声方法进行层压,然后测量厚度通过主动改变多层结构材料的温度并利用测量对象层在前一层的多次反射回波上的重叠方式因温度而变化的事实来改变第二层; COPYRIGHT:(C) 2015年,JPO&INPIT

著录项

  • 公开/公告号JP2015025664A

    专利类型

  • 公开/公告日2015-02-05

    原文格式PDF

  • 申请/专利权人 TORAY ENG CO LTD;

    申请/专利号JP20130153311

  • 发明设计人 ONODERA AKIRA;

    申请日2013-07-24

  • 分类号G01B17/02;

  • 国家 JP

  • 入库时间 2022-08-21 15:30:21

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