首页> 外国专利> Elemental by quantitative analysis methods and elemental by quantitative analysis apparatus according to the X-ray absorption edge method

Elemental by quantitative analysis methods and elemental by quantitative analysis apparatus according to the X-ray absorption edge method

机译:元素定量分析方法和元素定量分析装置根据X射线吸收边缘法

摘要

PROBLEM TO BE SOLVED: To provide a quantitative analysis method for measuring average density, the whole quantity, etc. of the respective elements contained in an object to be measured nondestructively by using a comparatively simple continuous X-ray source without using a large-scale device such as a synchrotron radiation facility (high energy electron storage ring), and to provide a quantitative analyzer by element for employing such quantitative analysis method.SOLUTION: Absorption edge jump of respective contained elements in an X-ray absorption spectrum of an object to be measured is calculated by using: a carbon-based cold cathode electron source; a target which is constituted of a conductive light element with an atomic number smaller than that of titanium and an electron emitted from a cold cathode electron source is made incident on a plane of incidence thereof, and which emits X-rays forward in the incident direction; a continuous X-ray source equipped with a shielding member which shields X-rays other than the X-rays generated by the target; and an energy discrimination type detector. Surface density on an X-ray transmission path is simultaneously measured for the respective elements contained in the object to be measured based on a mass absorption edge jump coefficient by every element predetermined by a standard sample, etc. and the absorption edge jump of the respective contained elements.
机译:解决的问题:提供一种定量分析方法,该方法通过使用相对简单的连续X射线源而不使用大规模方法,无损地测量被测物体中所含各个元素的平均密度,总量等。装置,例如同步加速器辐射设备(高能电子存储环),并提供采用这种定量分析方法的按元素定量分析仪。解决方案:物体在X射线吸收光谱中对所含元素的吸收边缘跃迁到通过使用以下方法计算被测物:碳基冷阴极电子源;使由原子序数比钛的原子序数小的导电光元件和从冷阴极电子源发射的电子构成的靶入射在其入射平面上,并沿入射方向向前发射X射线;连续X射线源,其具有遮蔽部件,该遮蔽部件遮蔽由靶产生的X射线以外的X射线。和能量鉴别型检测器。基于质量吸收边缘跳跃系数,通过由标准样品等预先确定的每个元素,同时针对被测量对象中包含的各个元素,同时测量X射线透射路径上的表面密度。包含的元素。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号