首页> 外国专利> RADIATION DETECTION ELEMENT SUBSTRATE, INSPECTION DEVICE FOR RADIATION DETECTION ELEMENT SUBSTRATE AND METHOD FOR INSPECTING RADIATION DETECTION ELEMENT SUBSTRATE

RADIATION DETECTION ELEMENT SUBSTRATE, INSPECTION DEVICE FOR RADIATION DETECTION ELEMENT SUBSTRATE AND METHOD FOR INSPECTING RADIATION DETECTION ELEMENT SUBSTRATE

机译:辐射检测元素基质,用于辐射检测元素基质的检查装置以及用于检查辐射检测元素基质的方法

摘要

PROBLEM TO BE SOLVED: To provide a radiation detection element substrate capable of inspecting a radiation detection element substrate having a plurality of transistors in one pixel without drastically adding or changing of the inspection device for the radiation detection element substrate having one transistor in one pixel, an inspection device for the radiation detection element substrate, and a method for inspecting the radiation detection element substrate.SOLUTION: A connection wiring part 22 for inspection in which control wirings M extend to the outside than a mounting substrate and are connected to each other, is provided. The gate off voltage is applied to wiring terminals 24 at one time, connected to the connection wiring part 22 for inspection, to perform the inspection.
机译:解决的问题:提供一种放射线检测元件基板,该放射线检测元件基板能够在一个像素内检查具有多个晶体管的放射线检测元件基板而无需大幅度增加或变更一个像素内具有一个晶体管的放射线检测元件基板的检查装置,放射线检测元件基板的检查装置及放射线检测元件基板的检查方法。检查用的连接配线部22中,控制配线M比安装基板延伸到外部并相互连接,提供。一次将栅极截止电压施加到接线端子24,并连接到用于检查的连接配线部分22,以执行检查。

著录项

  • 公开/公告号JP2015043563A

    专利类型

  • 公开/公告日2015-03-05

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP;

    申请/专利号JP20140132818

  • 发明设计人 ITO TAKAAKI;OKADA YOSHIHIRO;

    申请日2014-06-27

  • 分类号H04N5/32;G01R31/02;H04N5/374;H04N5/3745;H01L27/14;H01L27/146;A61B6;G01T7;

  • 国家 JP

  • 入库时间 2022-08-21 15:31:30

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号