首页> 外国专利> Laser annealing - or - annealing systems and methods with ultra-short residence - and / or holding times

Laser annealing - or - annealing systems and methods with ultra-short residence - and / or holding times

机译:具有超短停留时间和/或保持时间的激光退火或退火系统和方法

摘要

Laser annealing - or - annealing systems and methods for annealing or annealing of a semiconductor wafer with ultra-short believe - and / or residence times are disclosed. The laser annealing - or - annealing systems may comprise one or two laser beams, the at least partially overlapping. One of the laser beams is a preheating laser beam and the other laser beam is the annealing - or annealing laser beam. The annealing - or annealing laser beam scans sufficiently quickly, so that the holding - or residence time in the range from about 1 μs to about 100 μs is. These ultrashort residence - and / or holding times can be used for annealing - or annealing product wafer, formed from thin device wafers, since they prevent the side of the device wafer by means of heat during the annealing - or annealing process is damaged. Embodiments of individual laser beam annealing - or - annealing systems and - the method are likewise discloses.
机译:公开了用于以超短的置信度和/或停留时间对半导体晶片进行退火或退火的激光退火或退火系统和方法。激光退火系统可以包括一个或两个激光束,至少部分重叠。激光束之一是预热激光束,另一激光束是退火或退火激光束。退火或退火激光束扫描足够快,因此保持或停留时间在大约1μs到大约100μs的范围内。这些超短的停留和/或保持时间可用于退火-或退火由薄器件晶片形成的产品晶片,因为它们在退火过程中通过加热防止了器件晶片的侧面-或退火过程受到了损坏。同样公开了单个激光束退火或退火系统和方法的实施例。

著录项

  • 公开/公告号DE102013009419A1

    专利类型

  • 公开/公告日2013-12-12

    原文格式PDF

  • 申请/专利权人 ULTRATECH INC.;

    申请/专利号DE20131009419

  • 发明设计人 ANDREW M. HAWRYLUK;SERGUEI ANIKITCHEV;

    申请日2013-06-05

  • 分类号H01L21/268;B81C1/00;H01L21/324;H01L21/66;B23K26/00;

  • 国家 DE

  • 入库时间 2022-08-21 15:37:27

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