首页> 外国专利> Terahertz Real-time Detection and Imaging System for Nondestructive Testing Based on High Power Terahertz Radiation Source

Terahertz Real-time Detection and Imaging System for Nondestructive Testing Based on High Power Terahertz Radiation Source

机译:基于大功率太赫兹辐射源的太赫兹实时无损检测成像系统

摘要

The intensity of The present invention is a signal through a high-power terahertz wave generated by the high-power signal source, a power splitter and arranged so that the distribution is emitted to the transmitting antenna , by the signals reflected from a signal or sample through the sample to be imaged is focused on the array of receiving antennas to detect the specific object in a sample through the array detector , a real-time large area sample by reducing the number of signal sources necessary to measure and can be configured to detect and image device at a low cost , using a frequency multiplier at the same time that can reduce the interference between the resolution and the signal using a signal having a different frequency , the present invention relates to a high-power terahertz signal source based real-time detection and imaging devices for non-destructive testing . ;
机译:本发明的强度是通过高功率太赫兹波的信号,该信号由高功率信号源,功率分配器产生,并且被布置成使得从信号或样本反射的信号将分布发射到发射天线。通过将要成像的样本聚焦在接收天线阵列上,以通过阵列检测器检测样本中的特定对象,通过减少测量所需的信号源数量可以配置实时大面积样本,并且可以配置为检测以及低成本的图像设备,同时使用倍频器,可以降低分辨率和使用频率不同的信号之间的干扰,本发明涉及一种基于高功率太赫兹信号源的实用于无损检测的时间检测和成像设备。 ;

著录项

  • 公开/公告号KR101420226B1

    专利类型

  • 公开/公告日2014-07-18

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20120133458

  • 发明设计人 김정일;전석기;김근주;김재홍;

    申请日2012-11-23

  • 分类号G01N21/35;

  • 国家 KR

  • 入库时间 2022-08-21 15:40:31

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