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Dislocation reduction in non-polar III-nitride thin films

机译:非极性III型氮化物薄膜的位错减少

摘要

Lateral epitaxial overgrowth of non-polar III-nitride seed layers reduces threading dislocations in the non-polar III-nitride thin films. First, a thin patterned dielectric mask is applied to the seed layer. Second, a selective epitaxial regrowth is performed to achieve a lateral overgrowth based on the patterned mask. Upon regrowth, the non-polar III-nitride films initially grow vertically through openings in the dielectric mask before laterally overgrowing the mask in directions perpendicular to the vertical growth direction. Threading dislocations are reduced in the overgrown regions by (1) the mask blocking the propagation of dislocations vertically into the growing film and (2) the bending of dislocations through the transition from vertical to lateral growth.
机译:非极性III族氮化物晶种层的横向外延生长减少了非极性III族氮化物薄膜中的螺纹位错。首先,将薄的图案化电介质掩模施加到种子层。第二,基于图案化掩模执行选择性外延再生,以实现横向过度生长。在重新生长时,非极性III氮化物膜首先通过介电掩模中的开口垂直生长,然后在垂直于垂直生长方向的方向上横向过度生长掩模。通过(1)遮罩阻止位错垂直传播到生长的膜中以及(2)通过从垂直生长到侧向生长的过渡使位错弯曲,可以减少过度生长区域的螺纹位错。

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