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Light analyzer for observing the polarization properties of the single particle emission, light analysis computer program for its light and analytical methods

机译:用于观察单粒子发射的偏振特性的光分析仪,用于其光的光分析计算机程序和分析方法

摘要

Light analytical technique, using a scanning molecular counting method using an optical measurement using multiphoton microscopy or confocal microscopy, observing the polarization characteristics of the light-emitting particles are provided. In an optical analysis technique for observing the polarization characteristics of the light emitting particles of the present invention, while moving the position of the optical detection region of the optical system and the light detection area placed in the sample solution in by changing the optical path of the optical system of a microscope and irradiates the excitation light comprising a polarized light component which is determined in advance, and detects the intensity of the polarization components of at least one of the light from the light detection area, the light-emitting particles placed on the intensity of the polarization components of at least one of the detected light by detecting the individual signals of each, and calculating the polarization characteristic values ​​of the light-emitting particles on the basis of the intensity of the polarized component of at least one signal emitting particles detected. This observation of the polarization characteristics of the light emitting particle number density or concentration in the sample solution is low is possible.
机译:提供了一种光分析技术,该技术使用使用多光子显微镜或共聚焦显微镜的光学测量的扫描分子计数方法,观察发光粒子的偏振特性。在用于观察本发明的发光粒子的偏振特性的光学分析技术中,通过改变光学系​​统的光检测区域的位置和放置在样品溶液中的光检测区域的位置,来移动光学系统的光检测区域的位置和光检测区域。显微镜的光学系统,其照射包含预先确定的偏振光成分的激发光,并检测来自光检测区域的光中的至少一种的偏振光成分的强度,该发光粒子置于通过检测每一个的单独信号并基于至少一个的偏振分量的强度计算发光粒子的偏振特性值,来检测至少一个检测到的光的偏振分量的强度检测到信号发射粒子。样品溶液中发光粒子数密度或浓度的偏振特性的这种观察是低的。

著录项

  • 公开/公告号JPWO2012053355A1

    专利类型

  • 公开/公告日2014-02-24

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20120539662

  • 发明设计人 田邊 哲也;山口 光城;

    申请日2011-10-05

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 16:10:43

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