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Light analyzer for observing the polarization properties of the single particle emission, light analysis computer program for its light and analytical methods
Light analyzer for observing the polarization properties of the single particle emission, light analysis computer program for its light and analytical methods
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机译:用于观察单粒子发射的偏振特性的光分析仪,用于其光的光分析计算机程序和分析方法
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摘要
Light analytical technique, using a scanning molecular counting method using an optical measurement using multiphoton microscopy or confocal microscopy, observing the polarization characteristics of the light-emitting particles are provided. In an optical analysis technique for observing the polarization characteristics of the light emitting particles of the present invention, while moving the position of the optical detection region of the optical system and the light detection area placed in the sample solution in by changing the optical path of the optical system of a microscope and irradiates the excitation light comprising a polarized light component which is determined in advance, and detects the intensity of the polarization components of at least one of the light from the light detection area, the light-emitting particles placed on the intensity of the polarization components of at least one of the detected light by detecting the individual signals of each, and calculating the polarization characteristic values of the light-emitting particles on the basis of the intensity of the polarized component of at least one signal emitting particles detected. This observation of the polarization characteristics of the light emitting particle number density or concentration in the sample solution is low is possible.
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