首页> 外国专利> Sample substrate for laser desorption / ionization mass spectrometry, laser desorption / ionization mass spectrometry method and apparatus using the same

Sample substrate for laser desorption / ionization mass spectrometry, laser desorption / ionization mass spectrometry method and apparatus using the same

机译:用于激光解吸/电离质谱的样品基板,激光解吸/电离质谱的方法和使用该基板的设备

摘要

PROBLEM TO BE SOLVED: To provide a sample substrate for measuring soft LDI-MS capable of performing accurate measurement of high sensitivity without producing an obstruction peak when irradiated with a laser beam and capable of uniformly coating a sample in forming the sample in a sample substrate for analyzing laser eliminated ionization mass.;SOLUTION: In the sample substrate 50 subjected to the laser eliminated ionization mass analysis, the sample substrate is constituted so that carbon nanowalls 55 are vertically provided on a base stand and the surfaces of the carbon nanowalls are coated with the sample for mass analysis. The surfaces of the carbon nanowalls act as an ionizing medium with respect to the sample and is subjected to hydrophilizing treatment. By this constitution, a stable mass analysis of good precision and high sensitivity can be realized over a wide range from a low molecular weight to a high molecular weight.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种用于测量软LDI-MS的样品基板,该样品基板能够进行高灵敏度的准确测量,并且在被激光束照射时不会产生障碍峰,并且能够在样品基板中形成样品时均匀地涂覆样品解决方案:在经历了激光消除电离质量分析的样品基板50中,样品基板的结构使得碳纳米壁55垂直设置在基台上,并且碳纳米壁的表面被涂覆。与样品进行质量分析。碳纳米壁的表面相对于样品充当电离介质,并进行亲水化处理。通过这种结构,可以在从低分子量到高分子量的宽范围内实现稳定的质量分析和高灵敏度的质量分析。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP5406621B2

    专利类型

  • 公开/公告日2014-02-05

    原文格式PDF

  • 申请/专利权人 堀 勝;

    申请/专利号JP20090183797

  • 申请日2009-08-06

  • 分类号G01N27/62;H01J49/16;

  • 国家 JP

  • 入库时间 2022-08-21 16:11:05

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