PROBLEM TO BE SOLVED: To analyze whether a defect detected through final inspection is caused by a process stage or inspection stage.;SOLUTION: A linking part 17 of a defect causing stage analyzing device 16 reads illumination defect information and TFT correction information out of an information management database 9 as to one liquid crystal display panel, and relates both the results (what is called linking). A classification part 18 classifies the illumination defect information by the TFT correction information. An overlap mapping part 19 maps the classified illumination defect information on the same coordinates one over another as to one lot or a plurality of lots of liquid crystal display panels. A map display part 20 displays one or a plurality of overlap maps which are preset or specified by an operator among the plurality of overlap maps which are thus obtained.;COPYRIGHT: (C)2014,JPO&INPIT
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