首页> 外国专利> OPTICAL DEFECT DETECTION CLASSIFICATION METHOD AND OPTICAL DEFECT DETECTION CLASSIFICATION APPARATUS

OPTICAL DEFECT DETECTION CLASSIFICATION METHOD AND OPTICAL DEFECT DETECTION CLASSIFICATION APPARATUS

机译:光学缺陷检测分类方法和光学缺陷检测装置

摘要

PROBLEM TO BE SOLVED: To provide an optical defect detection classification method capable of excluding a defect repaired in a previous step from defects detected in a present step and capable of improving defect detection/classification accuracy.;SOLUTION: In the optical defect detection classification method, repaired data of a defect (205) concerned with first processing which is repaired in a previous step A-2 are excluded from defect data of defects (205, 206, 207) detected by optically inspecting an inspection target (L) applied to second processing (B-1) and the defect data left after the exclusion are extracted as defect data of the defects generated in a present step. Consequently second detection of the repaired defect (205) as a defect can be avoided, useless increases in a detection frequency of defects and defect sorts can be suppressed and detection accuracy and classification accuracy of defects can be improved.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种光学缺陷检测分类方法,该方法能够从当前步骤中检测出的缺陷中排除先前步骤中修复的缺陷,并且能够提高缺陷检测/分类的准确性。因此,从通过光学检查应用于第二步骤的检查目标(L)而检测到的缺陷(205、206、207)的缺陷数据中排除了在先前步骤A-2中修复的与第一处理有关的缺陷(205)的修复数据。处理(B-1)和排除之后剩余的缺陷数据被提取为在当前步骤中生成的缺陷的缺陷数据。因此,可以避免第二次检测到已修复的缺陷(205)作为缺陷,缺陷的检测频率无用地增加,可以抑制缺陷的种类,并且可以提高缺陷的检测精度和分类精度。;版权所有:(C)2014 ,JPO&INPIT

著录项

  • 公开/公告号JP2014074698A

    专利类型

  • 公开/公告日2014-04-24

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP20120223432

  • 发明设计人 KYOHO MASANORI;

    申请日2012-10-05

  • 分类号G01N21/956;

  • 国家 JP

  • 入库时间 2022-08-21 16:16:30

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