首页> 外国专利> MEASUREMENT DEVICE FOR CONCAVE SURFACE OPTICAL ELEMENT, MEASUREMENT DEVICE FOR CONCAVE SURFACE DIFFRACTION GRATING, AND MEASUREMENT DEVICE FOR FLAT SURFACE DIFFRACTION GRATING

MEASUREMENT DEVICE FOR CONCAVE SURFACE OPTICAL ELEMENT, MEASUREMENT DEVICE FOR CONCAVE SURFACE DIFFRACTION GRATING, AND MEASUREMENT DEVICE FOR FLAT SURFACE DIFFRACTION GRATING

机译:凹面光学元件的测量装置,凹面衍射光栅的测量装置以及平坦表面衍射光栅的测量装置

摘要

PROBLEM TO BE SOLVED: To provide a measurement device capable of quantitatively measuring a stray light value of a concave surface optical element in the same condition as a mounting state.;SOLUTION: A measurement device of a concave surface optical element 7 includes: a concave surface optical element; a rotation stage 6 that rotates the concave optical element; a laser device 1 that can change a distance to the rotation stage and is a light source irradiating the concave surface optical element with light; and a photodetector 8 that forms a predetermined angle with a line connecting the light source and the rotation stage, can change the distance to the rotation stage, and detects light reflected at a position other than a light focusing-point out of light reflected from the concave surface optical element.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种能够在与安装状态相同的条件下定量地测量凹面光学元件的杂散光值的测量装置。解决方案:凹面光学元件7的测量装置包括:凹面表面光学元件旋转台6使凹型光学元件旋转。激光装置1,其能够改变到旋转台的距离,并且是对凹面光学元件照射光的光源。光电检测器8,该光电检测器8与连接光源和旋转台的线形成预定角度,并且能够改变到旋转台的距离,并检测从光的反射光中的,在光聚焦点以外的位置反射的光。凹面光学元件。; COPYRIGHT:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014134449A

    专利类型

  • 公开/公告日2014-07-24

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORP;

    申请/专利号JP20130002447

  • 发明设计人 EHATA YOSHISADA;NAKAI NAOYA;

    申请日2013-01-10

  • 分类号G01M11/00;G01J3/18;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:40

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