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METHOD OF MANUFACTURING AVALANCHE PHOTODIODE BY Bi-CMOS PROCESS

机译:Bi-CMOS工艺制造雪崩光电二极管的方法

摘要

PROBLEM TO BE SOLVED: To provide a photodiode that prevents breakdown at a pn-junction end.SOLUTION: A radiation detector 46 includes a semiconductor layer 12 formed on a substrate 14 and a scintillator 30 formed on the semiconductor layer 12. The semiconductor layer 12 includes an n-type doped region 16 disposed so as to be adjacent to the substrate 14 and a p-type doped region 18 disposed so as to be adjacent to the n-type doped region 16. In the semiconductor layer 12, a trench 20 is formed. The trench 20 surrounds the p-type doped region 18, reduces the curvature of a pn junction at an end of the pn junction, and is filled with material 22 that prevents breakdown at the end. The scintillator 30 is disposed on the p-type doped region 18 so as to be optically coupled to the region 18. The radiation detector 46 further includes at least one conductive electrode 24 being electrically in contact with the n-type doped region 16.
机译:解决的问题:提供防止在pn结端击穿的光电二极管。解决方案:辐射检测器46包括形成在衬底14上的半导体层12和形成在半导体层12上的闪烁体30。半导体层12包括布置成与衬底14相邻的n型掺杂区16和布置成与n型掺杂区16相邻的p型掺杂区18。在半导体层12中,沟槽20形成了。沟槽20围绕p型掺杂区域18,减小了pn结的端部处的pn结的曲率,并且填充有防止端部击穿的材料22。闪烁体30设置在p型掺杂区域18上,以与区域18光学耦合。放射线检测器46还包括至少一个与n型掺杂区域16电接触的导电电极24。

著录项

  • 公开/公告号JP2014045198A

    专利类型

  • 公开/公告日2014-03-13

    原文格式PDF

  • 申请/专利权人 KONINKLIJKE PHILIPS NV;

    申请/专利号JP20130194906

  • 发明设计人 ANCO HERINGA;THOMAS FRACH;AGARWAL PRABHAT;

    申请日2013-09-20

  • 分类号H01L31/107;G01T1/20;G01T1/161;H01L27/146;H01L27/144;

  • 国家 JP

  • 入库时间 2022-08-21 16:19:41

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