首页> 外国专利> Calibration standard for use in X-ray fluorescence analyzer, has sample holder that is set for executing calibration in rotation around axis, so that calibration sample is passed-over from measuring spot during calibration of elements

Calibration standard for use in X-ray fluorescence analyzer, has sample holder that is set for executing calibration in rotation around axis, so that calibration sample is passed-over from measuring spot during calibration of elements

机译:X射线荧光分析仪中使用的校准标样,具有样品架,该样品架被设置为围绕轴旋转执行校准,以便在元素校准过程中将校准样从测量点移出

摘要

The calibration standard has a sample holder (12) made from aluminum, wood, graphite or plastic and a calibration sample that is arranged in or at sample holder, where the sample holder is supported around an axis (R) in a rotating manner. The calibration sample has multiple elements (14,14a-14l). The sample holder is set for executing the calibration in rotation around the axis, so that the calibration sample is passed-over from measuring spot (M) during the calibration of individual elements, so that a reference spectrum is generated by time inetgration of the resulting measurement signal.
机译:校准标样具有由铝,木材,石墨或塑料制成的样品架(12),以及布置在样品架内或样品架上的校准样品,其中样品架围绕轴(R)旋转地支撑。校准样品具有多个元素(14,14a-14l)。设置样品架以执行绕轴旋转的校准,以便在单个元素校准期间将校准样品从测量点(M)传递过来,从而通过时间积分得到结果产生的参考光谱测量信号。

著录项

  • 公开/公告号DE102012021484B3

    专利类型

  • 公开/公告日2013-10-17

    原文格式PDF

  • 申请/专利权人 FRANZ BRENK GMBH & CO. KG;

    申请/专利号DE20121021484

  • 发明设计人 BRENK MARTIN;

    申请日2012-11-05

  • 分类号G01N23/223;G01N23/22;

  • 国家 DE

  • 入库时间 2022-08-21 16:21:56

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