首页> 外国专利> WAFER LEVEL PROTECTION STRUCTURE OF A MICRO DEVICE, THE MICRO DEVICE INCLUDING THE SAME, AND MANUFACTURING METHODS THEREOF CAPABLE OF IMPLEMENTING NORMAL PACKAGING BY REFLECTING THE INFLUENCE OF THE WARPAGE OF A WAFER

WAFER LEVEL PROTECTION STRUCTURE OF A MICRO DEVICE, THE MICRO DEVICE INCLUDING THE SAME, AND MANUFACTURING METHODS THEREOF CAPABLE OF IMPLEMENTING NORMAL PACKAGING BY REFLECTING THE INFLUENCE OF THE WARPAGE OF A WAFER

机译:微设备的晶圆级保护结构,包括该微设备的微设备及其制造方法,能够通过反映晶圆翘曲的影响来实现正常包装

摘要

PURPOSE: A wafer level protection structure of a micro device, the micro device including the same, and manufacturing methods thereof are provided to efficiently protect a driving part of the micro device by installing a wafer level protection structure in a contact part with the driving part of the micro device.;CONSTITUTION: An elastic spacer(32A) is formed on a first surface of a substrate(30). The elastic spacer is made of a silicon resin. The silicon resin is one of PMDS(Polydimethylsiloxane), PMPS(Polymethylphenylsiloxane), and PVS(Polyvinylsiloxane). A adhesion preventing layer(34) is formed on the first surface inside the spacer and is one of a metal layer, an oxide layer, and a nitride layer. The oxide layer includes one of Al2O3, TiO2, Cr2O3, Ta2O3, and LTO.;COPYRIGHT KIPO 2013
机译:用途:提供一种微器件的晶片级保护结构,包括该微器件的微器件及其制造方法,以通过在与驱动部件的接触部分中安装晶片级保护结构来有效地保护微器件的驱动部件。组成:弹性垫片(32A)形成在基板(30)的第一表面上。弹性垫片由硅树脂制成。硅树脂是PMDS(聚二甲基硅氧烷),PMPS(聚甲基苯基硅氧烷)和PVS(聚乙烯基硅氧烷)中的一种。防粘层(34)形成在隔离物内部的第一表面上,并且是金属层,氧化物层和氮化物层之一。氧化层包括Al2O3,TiO2,Cr2O3,Ta2O3和LTO中的一种。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR20130022612A

    专利类型

  • 公开/公告日2013-03-07

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20110085320

  • 发明设计人 LEE JEONG YUB;

    申请日2011-08-25

  • 分类号H01L21/56;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:37

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