首页> 外国专利> A BEAM LINE FOR A SOURCE OF EXTREME ULTRAVIOLET (EUV) RADIATION

A BEAM LINE FOR A SOURCE OF EXTREME ULTRAVIOLET (EUV) RADIATION

机译:用于极端紫外线(EUV)辐射源的光束线

摘要

The invention relates to a beam line (30) for a source of extreme ultraviolet (EUV) radiation, wherein a EUV-radiating plasma is generated by irradiating droplets of a suitable target material with a focused laser beam (5) at a plasma generation point, said beam line (30) comprising within a vacuum chamber (7): a beam delivery system (2) comprising a focusing lens and means for cooling and shielding said focusing lens; a EUV mirror collector (1), which collects and focuses the radiated EUV in a EUV beam (6) at an intermediate focus (IF); a beam dump (3) capable of damping at least a portion of the laser beam (5) without imposing a shadow on the collected and focused EUV beam (6); and an intermediate focus module (4) for blocking particles from leaving the vacuum chamber (7) with the EUV beam (6).
机译:本发明涉及用于极紫外(EUV)辐射源的光束线(30),其中通过在等离子体产生点处用聚焦激光束(5)照射合适的目标材料的液滴来产生EUV辐射等离子体。 ,所述光束线(30)包括在真空室(7)内:光束传输系统(2),其包括聚焦透镜和用于冷却和屏蔽所述聚焦透镜的装置; EUV镜收集器(1),其将辐射的EUV收集并聚焦在中间焦点(IF)的EUV光束(6)中;光束收集器(3),其能够衰减至少一部分激光束(5),而不会在收集和聚焦的EUV光束(6)上施加阴影。中间聚焦模块(4),用于阻止粒子随EUV光束(6)离开真空室(7)。

著录项

  • 公开/公告号EP2550564A1

    专利类型

  • 公开/公告日2013-01-30

    原文格式PDF

  • 申请/专利权人 ETH ZURICH;

    申请/专利号EP20110714925

  • 申请日2011-03-16

  • 分类号G03F7/20;

  • 国家 EP

  • 入库时间 2022-08-21 16:31:07

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